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EBTW07 is supported by:
IEEE Board Test Technology Activities Committee (BTTAC)
The original purpose of BTTAC (formerly BTAG) was to identify a group of board test professionals to help
bring back board test into the International Test Conference (ITC).
In that respect, we started a process at ITC 2002 that included the first Board Test Workshop (BTW).
This workshop, held in the USA, has now passed its fourth year and, additionally, we have added the
European Board Test Workshop (EBTW) as a European satellite event.
EBTW07 is sponsored by:
JTAG Technologies
JTAG Technologies is world leader in boundary-scan technology and provider of Boundary-Scan (JTAG/IEEE 1149.1)
products and services for boundary-scan testing of printed circuit boards and systems,
in-system programming (ISP) of flash memory and PLDs.
GOEPEL
As a leading provider GÖPEL electronic develops and manufactures intelligent solutions for the test of mounted
PCBs and electronic devices in these spheres of activity: JTAG/Boundary Scan Systems, Automotive Test Systems,
AOI Systems, Functional Test Systems
International Test Technologies
Formed in 1992, International Test Technologies is now the world leader in manufacturing test and hardware debug
solutions for processor-based boards
ASSET Intertech
As the leader in boundary scan, ASSET InterTech is the only company that gives you access to a complete solution that
extends beyond hardware and software, to consulting, service, training and support. No one gives you access to more.
CISCO
Cisco enables people to make powerful connections-whether in business, education, philanthropy, or creativity.
Cisco hardware, software, and service offerings are used to create the Internet solutions that make networks
possible-providing easy access to information anywhere, at any time.
Test Technology Technical Council
TTTC is a volunteer professional organization sponsored by the IEEE Computer Society.
TTTC's goals are to contribute to our members' professional development and advancement,
to help them solve engineering problems in electronic test, and to help advance the state-of-the art.
TTTC aims at facilitating the knowledge flow in an integrated manner,
to ensure the overall quality in terms of technical excellence, fairness, openness, and equal opportunities
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 | Feb. 25th, 2007: Submission |
 | April 15th, 2007: Notification of acceptance |
 | May 13th, 2007: Final paper due |
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General Chair: Jim Webster
Program Chair: Bill Eklow
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EBTW07 is sponsored by the
Test Technology Technical Council (TTTC)
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